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Method and system for image analysis
Zebaze, Roger Mackie, Eleanor Jean Bohte, Anne Mbala, Aloys Ghasemzadeh, Ali Seeman, Ego
Zebaze, Roger
Mackie, Eleanor Jean
Bohte, Anne
Mbala, Aloys
Ghasemzadeh, Ali
Seeman, Ego
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Abstract
A computer-implemented method for analyzing a sample comprising a first material and a second material of generally different densities and having a junction therebetween. The method comprises: defining automatically a plurality of regions of interest within an image of the sample, each of said regions of interest having a width of one or more voxels or pixels; determining respective density, intensity or attenuation profiles within the regions of interest; determining a location of said junction including defining a first reference point within one of said first and second materials and employing the first reference point as current reference point, and (i) determining a closest point to said current reference point that is on said respective profile and in the other of said first and second materials to that of the current reference point; (ii) locating a greatest difference in values of the respective profile between an adjacent peak and trough in a segment of the respective profile between said current reference point and said closest point; and (iii) locating a point of inflexion in said segment.
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Date
2016
Type
Patent
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All rights reserved
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Open